Application of epifluorescence light microscopy (EFLM) to study the microstructure of wheat dough: a comparison with confocal scanning laser microscopy (CSLM) technique

AuthorsPeighambardoust SH- Dadpour MR- Dokouhaki M
JournalJournal of Cereal Science
Presented byبله
Page number21-27
Volume number51
Paper TypeFull Paper
Published At2010
Journal GradeISI
Journal TypeTypographic
Journal CountryNetherlands
Journal IndexQ1

Abstract

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